Lindsay

Lindsay Lab: Patents

  • "Devices based on molecular electronics" S.M. Lindsay, D. Gust and X.D. Cui, US Patent 6,673,424, Jan 6, 2004.
  • "Vibrating tip conducting probe microscope" S.M. Lindsay, Tianwei Jing, US Patent 6,245,204, June 12, 2001.
  • "Magnetic modulation of force sensor for AC detection in an atomic force microscope" W. Han, S.M. Lindsay, T.W. Jing, US Patent 6134955, October 24, 2000.
  • "Force sensing probe for scanning probe microscopy" S.M. Lindsay and T.W. Jing, US Patent 6,121,611, September 19, 2000
  • "Intrapulmonary delivery device" A. Wachter and S.M. Lindsay, US Patent 6,085,742 July 11, 2000
  • "Conducting scanning probe microscope with environmental control" S.M. Lindsay and T.W. Jing, US Patent 6,051,825 April 18, 2000
  • "Tip coating system for scanning probe microscopy" S.M. Lindsay, T.W. Jing, Y.L. Lyubchenko, Gall, A.A. US Patent 6,017,590, Jan. 2000
  • "Microscope for compliance measurement" S.M. Lindsay, T.W. Jing. W. Han, US Patent 5,983,712, November 16, 1999.
  • "Cantilevers for a magnetically driven atomic force microscope" W. Han, S.M. Lindsay, T.W. Jing, US Patent 5,866,805, February 2, 1999.
  • "Heated Stage for a scanning probe microscope" S.M. Lindsay and T.W. Jing, US Patent 5821545, Oct. 13, 1998.
  • "Scanning probe microscope for use in fluids" S.M. Lindsay and T.W. Jing, U.S. Patent 5,750,989, May 12, 1998.
  • "Magnetically-oscillated probe microscope for operation in liquids" Han; Wenhai, Lindsay; S. M., Harbaugh; Steven K., Jing; Tianwei U.S. Patent 5,753,814, May 19, 1998
  • "Scanning probe microscope" S.M. Lindsay and T.W. Jing, U.S. Patent 5,760,396, June 2, 1998.
  • "MDI device with ultrasound sensor to detect aerosol dispensing", Alan Wachter and S.M. Lindsay, U.S. Patent 5,794,612, August 18, 1998.
  • "Hybrid control system for scanning probe microscopes", S.M. Lindsay and T.W. Jing, US Patent 5,805,448, September 8, 1998.
  • "Scanning Probe Microscope" S.M. Lindsay and T. Jing, US Patent 5,675,154, October 7, 1997.
  • "Variable Temperature Scanning Probe Microscope based on a Peltier Device" S.M. Lindsay, US Patent 5,654,546, August 5, 1997.
  • "Microscope for Force and Tunneling Microscopy in Liquids" S.M. Lindsay, US Patent 5,621,210, April 15, 1997.
  • "Tip Etching System and Method for Etching Platinum-Containing Wire", S.M. Lindsay, Tianwei Jing, Yuri Lyubchenko and A.A. Gall, US Patent 5,630,932, May 20, 1997.
  • "Formation of a Magnetic Film on an Atomic Force Microscope Cantilever", S.M. Lindsay, US Patent 5,612,491, March 18, 1997.
  • "Controlled force microscope for operation in liquids" S.M. Lindsay, US Patent 5,515,719, May 14, 1996
  • "Magnetic modulation of force sensor for AC detection in an atomic force microscope" S.M. Lindsay, US Patent 5,513,518, May 7, 1996.
  • "Method of electrochemical identification of single organic molecules using scanning tunneling microscopy", N.J. Tao, S.M. Lindsay, US Patent 5,497,000, March 5, 1996.
  • "Electrochemical Identification of molecules in a scanning probe microscope", S.M. Lindsay, T.W. Jing, US Patent 5,495,109, Feb. 27, 1996.
  • "Potentiostatic Preparation of Molecular Adsorbates for Scanning Probe Microscopy" S.M. Lindsay, US Patent 5,155,361, October 13, 1992 and RE 35317, August 27, 1996.
  • "A Method for Visualizing the Base Sequence of Nucleic Acid Polymers" S.M. Lindsay and M. Philipp, US Patent 5,106,729, April 21, 1992.
  • "Cell and Substrate for Electrochemical Studies" S.M. Lindsay, US Patent 4,868,396, Sept. 19, 1989.